fig10

Figure 10. TEM characterization of the Al/Al₃Er interface in the alloy cooled at 40 °C/h. (A) Backscattered electron image showing the location of TEM specimen preparation; (B) HRTEM image of the Al/Al₃Er interface and (C) corresponding SAED pattern. TEM: Transmission electron microscopy; HRTEM: high-resolution transmission electron microscopy; SAED: selected-area electron diffraction.